Comment citer Mountains dans un article de recherche ?
Le logiciel Mountains® est fréquemment utilisé dans des travaux de recherche et les résultats et les illustrations issues de Mountains sont inclus dans des publications scientifiques. Cette page recommande les formats de citation adaptés à inclure dans vos articles.
Conventions de citation du logiciel Mountains®
- Convention APA : Digital Surf (2025) Logiciel Mountains® version 11.0.0.11081, www.digitalsurf.com
- Convention IEEE : Logiciel Mountains®, Digital Surf, 2025, version 11.0.0.11081, www.digitalsurf.com
- Convention BibTeX : @software{Mountains, author = {{Digital Surf}}, title = {Mountains software}, url = {www.digitalsurf.com}, version= {11.0.0.11081}, address = {Besançon, France}, year = {2025}, }
Le numéro de version est visible dans le dialogue "A propos", dans l'onglet "Aide".
Le nom générique, Mountains®, mentionné ci-dessus peut être remplacé par le produit spécifique :
Le logiciel Mountains® est une référence pour l'analyse des surfaces et un outil primordial pour la recherche. Ses algorithmes sont conformes et vérifiés avec des méthodes rigoureuses. En savoir plus sur nos méthode qualité et sur la vérification des algorithmes de paramètres.
Publications scientifiques citant Mountains®
De nombreux chercheurs mentionnent l'utilisation du logiciel Mountains® dans leurs publications. Ces publications sont listées sur ce site, jusqu'en 2017, date à partir de laquelle les publications citant Mountains ont été trop nombreuses pour être listées. Voir les publications citant Mountains.
Articles écrits ou co-écrits par Digital Surf
Certains de nos collaborateurs, ingénieurs ou chercheurs, publient dans différents journaux et interviennent dans des conférences. Leurs travaux sont mentionnés ci-dessous. N'hésitez pas à référencer ces travaux dans vos articles.
- 2024 : Blateyron F, Breton S, Mathematical softgauges for material ratio parameters, Surface Topography: Metrology and Properties, DOI 10.1088/2051-672X/ad6f2e
- 2024 : Blateyron F, The areal field parameters, chapter 2, Characterization of areal surface texture, 2nd edition, Richard Learch ed, Springer, ISBN: 978-3-031-59309-3
- 2024 : Blateyron F, The areal feature parameters, chapter 3, Characterization of areal surface texture, 2nd edition, Richard Learch ed, Springer, ISBN: 978-3-031-59309-3
- 2024 : Brown C A, Blateyron F, Berglund J, Murrison A J, Jeswiek J, Spatial frequency decomposition with bandpass filters for multiscale analyses and functional correlations, Surface Topography: Metrology and Properties, DOI 10.1088/2051-672X/ad6f2f
- 2024 : Moreau C, Bigerelle M, Marteau J, Lemesle J, Páez D, Guibert R, Blateyron F, Brown C A, A novel methodology to assess optical profilometer stability to discriminate surface roughness, Surface Topography: Metrology and Properties, DOI 10.1088/2051-672X/ad4378
- 2024 : Moreau C, Lemesle J, Páez D, Blateyron F, Bigerelle M, Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps, Metrology, 4(2):141-163
- 2024 : Zeng W, Blateyron F, Lou S, Scott P, Jiang , Advancements in 3D Surface Characterization: Developing Novel Filtration Techniques for Complex Freeform Surfaces, 24th International Conference on Metrology and Properties of Surfaces, Marrakech,
- 2023 : Lemesle J, Moreau C, Deltombe R, Martin J, Blateyron F, Bigerelle M, Brown C A, Height Fluctuations and Surface Gradients in Topographic Measurements. Materials, 16(15):5408
- 2023 : Lemesle J, Moreau C, Deltombe R, Blateyron F, Martin J, Bigerelle M, Brown C A, Top-down Determination of Fluctuations in Topographic Measurements. Materials, 16(2):473
- 2023 : Blateyron F, Differences between ISO 21920 and ISO 4287, CIRP Winter meeting, STC-S, Paris
- 2023 : Lewandowska R, Gonzalez N, Recent software developments for full spectral analysis of Raman, IR, cathodoluminescence spectra etc . The 10th International Conference on Advanced Applied Raman Spectroscopy, Paris.
- 2022 : Calandra I, Bob K, Merceron G, Blateyron F, Hildebrandt A, Schulz-Kornas E, Souron A, Winkler D E, Surface texture analysis in Toothfrax and MountainsMap® SSFA module: Different software packages, different results?. PCI Archeology,
- 2022 : Blateyron F, Jiang XQ, Analysis software for Additive Manufacturing surface texture, CIRP Winter meeting, Paris
- 2022 : Blateyron F, Surface texture analysis of complex additive manufactured surfaces, keynote, Euspen Special Interest Group Meeting: Structured and Freeform surfaces, Huddersfield, UK
- 2022 : Blateyron F, Zupancic B, Gascuel JD, Generation of triangle mesh softgauges and AM material measures for surface texture characterization, EUSPEN International conference and exhibition, Genève (CH)
- 2021 : Blateyron F, Leroy B, Optimal characterization of profile features, Surface Topography: Metrology and Properties, 9(1) DOI 10.1088/2051-672X/abce0f
- 2021 : Jiang XQ, Senin N, Scott P, Blateyron F, Feature-based surface topography: Characterisation and applications, CIRP Annals Manufacturing Technology, 70(2)
- 2020 : Blateyron F, Senin N, Post-Process Surface Metrology, chapitre du livre Precision Metal Additive Manufacturing, CRC Press
- 2020 : Todhunter L, Leach R, Blateyron F, Mathematical approach to the validation of surface texture form removal software. Surface Topography: Metrology and Properties, 8(4)
- 2020 : Todhunter L, Leach R, Blateyron F, Mathematical approach to the validation of surface texture filtration software. Surface Topography: Metrology and Properties
- 2020 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Mathematical approach to the validation of field surface texture parameter software. Surface Topography: Metrology and Properties, 8(1)
- 2019 : Blateyron F, Leroy B, An exploration of motifs parameters using watershed segmentation and morphological envelopes, Metrology and Properties of Engineering Surfaces, Lyon
- 2019 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Mathematical reference standards for validating software for calculating surface texture parameters, Metrology and Properties of Engineering Surfaces, Lyon
- 2019 : Blateyron F, Leroy B, Proposal for a simplified framework for surface texture parameters, CIRP STC-S meeting, Paris
- 2018 : Brown C, Hansen HN, Jiang XQ, Blateyron F, Berglund J, Senin N, Bartkowiak T, Dixon B, Le Goïc G, Quinsat Y, Stemp WJ, Thompson MK, Ungar PS, Zahouani H, Multiscale analyses and characterizations of surface topographies, CIRP Annals Manufacturing Technology
- 2018 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Development of mathematical reference standards for the validation of surface texture parameter calculation software, Journal of Physics, conference series
- 2018 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, A programmable software framework for the generation of simulated surface topography, Conference EUSPEN 2018, Venice, Italy
- 2018 : Blateyron F, Stratified surface, CIRPedia, Encyclopedia of Production Engineering
- 2018 : Mignot C, Color (and 3D) for Scanning Electron Microscopy, Microscopy Today, Microscopy Society of America, Oxford University Press.
- 2018 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, A programmable software framework for the generation of simulated surface topography, Conference EUSPEN 2018, Venice, Italy
- 2017 : Faivre A, Analyse d'image hyperspectrale, PhD Thesis, Université de Bourgogne Franche-Comté, Laboratoire de Mathématiques de Besançon.
- 2017 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Development of mathematically-defined surfaces. Postgraduate Institute Conference.
- 2017 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, An analysis of Type F2 software measurement standards for profile surface texture parameters. Advanced Mathematical and Computational Tools in Metrology and Testing XI
- 2017 : Cuenin J, Faivre A, Kokonendji CC, On generalized variance of product of powered components and multiple stable Tweedie models, Statistics-Theory and Methods
- 2017 : Blateyron F, New Sliding Bandpass Filters for Multiscale Exploration of Surface Texture, Metrology and Properties of Engineering Surfaces. Poster
- 2017 : Faivre A, Dombry C, Total variation regularized non-negative matrix factorization for smooth hyperspectral unmixing, arXiv preprint arXiv:1706.09242, 2017
- 2017 : Bigerelle M, Marteau J, Blateyron F, Assessing the discriminating power of roughness parameters using a roughness databank, Surface Topography: Metrology and Properties. 5. 025002. 10.1088/2051-672X/aa6e04.
- 2017 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, An analysis of Type F2 software measurement standards for profile surface texture parameters, Measurement Science and Technology
- 2016 : Mignot C, A whole new world of colour (and 3D) for electron microscopy, inFocus, revue de la Royal Society of Microscopy, UK.
- 2016 : Chrétien S, Dombry C, Faivre A, A Semi-Definite Programming approach to low dimensional embedding for unsupervised clustering, arXiv preprint arXiv:1606.09190
- 2016 : Faivre A, Chrétien S, Dombry C, A Semi-Definite Programming approach to Gaussian Mixture based clustering, Informal publication on ResearchGate.
- 2016 : Blateyron F, Segmentation and feature parameters - A corrected definition of watershed segmentation and feature parameters defined in ISO 25178-2, International Conference on Surface Metrology, Poznan, Pologne
- 2015 : Blateyron F, Proposed corrections for the ISO 25178 standard series on areal surface texture, Communication à l'ISO TC213 WG16
- 2014 : Blateyron F, Good practices for the use of areal filters, 3rd seminar on surface metrology of the Americas, Albuquerque, NM, USA
- 2014 : Blateyron F, Correlative surface analysis, International Conference on Surface Metrology, Hambourg, Allemagne
- 2013 : Blateyron F, The areal field parameters, chapter 2, Characterization of areal surface texture, Richard Learch ed, Springer, ISBN: 978-3-642-36457-0
- 2013 : Blateyron F, The areal feature parameters, chapter 3, Characterization of areal surface texture, Richard Learch ed, Springer, ISBN: 978-3-642-36457-0
- 2012 : Blateyron F, Preparation and cleaning of raw acquisition files, International Conference on Surface Metrology, Annecy, France
- 2012 : Blateyron F, Chromatic confocal microscopy, chapter 5, Optical measurement of surface topography, Richard Leach ed, Springer, ISBN: 978-3-642-12011-4
- 2011 : Blateyron F, Surface characterization based upon significant topographic features, 13th International Conference on Metrology and Properties of Engineering Surfaces, National Physical Laboratory, UK
- 2011: Hajri S, Sadier B, Jaillet S, Thomas M, Delannoy J-J, Identification and extraction by segmentation of speleothems of Orgnac, Cahiers de géographie, Edytem.
- 2010 : Blateyron F, Characterization of local features on functional surfaces, International Conference on Surface Metrology, WPI Worcester, USA
- 2010 : Blateyron F, Two advanced characterization methods of surface properties, Tribology Symposium, Tokyo, Japan
- 2010 : Hajri S, Modélisation des surfaces rocheuses naturelles à partir d’une scannerisation laser 3D et extraction automatique de formes caractéristiques : application aux spéléothèmes et surfaces géologiques. PhD Thesis. Université de Savoie-Mont Blanc.
- 2009 : Blateyron F, Calculating 3D surface texture parameters according to ASME B46.1 and ISO 25178, International Conference on Surface Metrology, WPI Worcester, USA
- 2009 : Hajri S, Sadier B, Jaillet S, Ployon E, Boche E, Chakroun A, Saulnier G-M, Delannoy J-J, Analyse spatiale et morphologique d'une forêt de stalagmites par modélisation 3D dans le réseau d'Orgnac, Karstologia, ISSN 0751-7688
- 2008 : Blateyron F, Caulcutt A, Surface Analysis Leaps into the Fourth Dimension, Quality Magazine, July
- 2007 : Blateyron F, 3D Oberflächen Messtechnik, Quality Engineering, Germany
- 2007 : Blateyron F, A revolution in 3D Surface Metrology, NDT Nondestructive testing (Quality Magazine)
- 2006 : Blateyron F, Etats de surface : la norme ISO 25178 va tout changer, Mesures, 787, pp44-47, France
- 2006 : Blateyron F, 3D Imaging and Analysis using Surface Metrology Software, Imaging & Microscopy
- 2006 : Blateyron F, 3D parameters and new filtration techniques, Japan Society of Production Engineering, Tokyo, Japon
- 2005 : Blateyron F, Cotation ISO : les nouvelles normes, quelles conséquences, Journée d'information technique, UNM, Paris
- 2004 : Blateyron F, Application of image segmentation to motifs evaluation on 2D profiles, International Colloquium on Surfaces, Chemnitz, Allemagne
- 2002 : Mignot C, Complementarity and similitudes between colorimetry and profilometry, International congress of dermatology, Skin health and disease, Paris