How to cite Mountains in a research paper?
The Mountains® software is frequently used in research work and results and illustrations produced by Mountains are included in scientific publications. This page recommends citation formats for scientific papers.
Common styles to cite Mountains®
- APA style: Digital Surf (2025) Mountains® Software version 11.0.0.11081, www.digitalsurf.com
- IEEE style: Mountains® software, Digital Surf, 2025, version 11.0.0.11081, www.digitalsurf.com
- BibTeX style: @software{Mountains, author = {{Digital Surf}}, title = {Mountains software}, url = {www.digitalsurf.com}, version= {11.0.0.11081}, address = {Besançon, France}, year = {2025}, }
The version number of Mountains can be found in the "About" dialog in the "Help" tab.
The generic product name, Mountains®, mentioned above can be replaced by the specific product:
The Mountains® is a reference for surface analysis and an essential tool for researchers. Its algorithms are compliant and verified with rigourous methods. Read more about our quality methods and the verification methods of parameter algorithms.
Scientific publications citing Mountains®
Many researchers cite Mountains® in their publications. These publications are listed on this site, until 2017, after which too many publications citing Mountains made it impossible to list them. View the publications citing Mountains.
Publication written or co-authored by Digital Surf
Digital Surf collaborators, engineers and researchers, publish in several journals and contribute to conferences. Their work are referenced below. Do not hesitate to cite these publications in your papers.
- 2024 : Blateyron F, Breton S, Mathematical softgauges for material ratio parameters, Surface Topography: Metrology and Properties, DOI 10.1088/2051-672X/ad6f2e
- 2024 : Blateyron F, The areal field parameters, chapter 2, Characterization of areal surface texture, 2nd edition, Richard Learch ed, Springer, ISBN: 978-3-031-59309-3
- 2024 : Blateyron F, The areal feature parameters, chapter 3, Characterization of areal surface texture, 2nd edition, Richard Learch ed, Springer, ISBN: 978-3-031-59309-3
- 2024 : Brown C A, Blateyron F, Berglund J, Murrison A J, Jeswiek J, Spatial frequency decomposition with bandpass filters for multiscale analyses and functional correlations, Surface Topography: Metrology and Properties, DOI 10.1088/2051-672X/ad6f2f
- 2024 : Moreau C, Bigerelle M, Marteau J, Lemesle J, Páez D, Guibert R, Blateyron F, Brown C A, A novel methodology to assess optical profilometer stability to discriminate surface roughness, Surface Topography: Metrology and Properties, DOI 10.1088/2051-672X/ad4378
- 2024 : Moreau C, Lemesle J, Páez D, Blateyron F, Bigerelle M, Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps, Metrology, 4(2):141-163
- 2024 : Zeng W, Blateyron F, Lou S, Scott P, Jiang , Advancements in 3D Surface Characterization: Developing Novel Filtration Techniques for Complex Freeform Surfaces, 24th International Conference on Metrology and Properties of Surfaces, Marrakech,
- 2023 : Lemesle J, Moreau C, Deltombe R, Martin J, Blateyron F, Bigerelle M, Brown C A, Height Fluctuations and Surface Gradients in Topographic Measurements. Materials, 16(15):5408
- 2023 : Lemesle J, Moreau C, Deltombe R, Blateyron F, Martin J, Bigerelle M, Brown C A, Top-down Determination of Fluctuations in Topographic Measurements. Materials, 16(2):473
- 2023 : Blateyron F, Differences between ISO 21920 and ISO 4287, CIRP Winter meeting, STC-S, Paris
- 2023 : Lewandowska R, Gonzalez N, Recent software developments for full spectral analysis of Raman, IR, cathodoluminescence spectra etc . The 10th International Conference on Advanced Applied Raman Spectroscopy, Paris.
- 2022 : Calandra I, Bob K, Merceron G, Blateyron F, Hildebrandt A, Schulz-Kornas E, Souron A, Winkler D E, Surface texture analysis in Toothfrax and MountainsMap® SSFA module: Different software packages, different results?. PCI Archeology,
- 2022 : Blateyron F, Jiang XQ, Analysis software for Additive Manufacturing surface texture, CIRP Winter meeting, Paris
- 2022 : Blateyron F, Surface texture analysis of complex additive manufactured surfaces, keynote, Euspen Special Interest Group Meeting: Structured and Freeform surfaces, Huddersfield, UK
- 2022 : Blateyron F, Zupancic B, Gascuel JD, Generation of triangle mesh softgauges and AM material measures for surface texture characterization, EUSPEN International conference and exhibition, Genève (CH)
- 2021 : Blateyron F, Leroy B, Optimal characterization of profile features, Surface Topography: Metrology and Properties, 9(1) DOI 10.1088/2051-672X/abce0f
- 2021 : Jiang XQ, Senin N, Scott P, Blateyron F, Feature-based surface topography: Characterisation and applications, CIRP Annals Manufacturing Technology, 70(2)
- 2020 : Blateyron F, Senin N, Post-Process Surface Metrology, chapitre du livre Precision Metal Additive Manufacturing, CRC Press
- 2020 : Todhunter L, Leach R, Blateyron F, Mathematical approach to the validation of surface texture form removal software. Surface Topography: Metrology and Properties, 8(4)
- 2020 : Todhunter L, Leach R, Blateyron F, Mathematical approach to the validation of surface texture filtration software. Surface Topography: Metrology and Properties
- 2020 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Mathematical approach to the validation of field surface texture parameter software. Surface Topography: Metrology and Properties, 8(1)
- 2019 : Blateyron F, Leroy B, An exploration of motifs parameters using watershed segmentation and morphological envelopes, Metrology and Properties of Engineering Surfaces, Lyon
- 2019 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Mathematical reference standards for validating software for calculating surface texture parameters, Metrology and Properties of Engineering Surfaces, Lyon
- 2019 : Blateyron F, Leroy B, Proposal for a simplified framework for surface texture parameters, CIRP STC-S meeting, Paris
- 2018 : Brown C, Hansen HN, Jiang XQ, Blateyron F, Berglund J, Senin N, Bartkowiak T, Dixon B, Le Goïc G, Quinsat Y, Stemp WJ, Thompson MK, Ungar PS, Zahouani H, Multiscale analyses and characterizations of surface topographies, CIRP Annals Manufacturing Technology
- 2018 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Development of mathematical reference standards for the validation of surface texture parameter calculation software, Journal of Physics, conference series
- 2018 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, A programmable software framework for the generation of simulated surface topography, Conference EUSPEN 2018, Venice, Italy
- 2018 : Blateyron F, Stratified surface, CIRPedia, Encyclopedia of Production Engineering
- 2018 : Mignot C, Color (and 3D) for Scanning Electron Microscopy, Microscopy Today, Microscopy Society of America, Oxford University Press.
- 2018 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, A programmable software framework for the generation of simulated surface topography, Conference EUSPEN 2018, Venice, Italy
- 2017 : Faivre A, Analyse d'image hyperspectrale, PhD Thesis, Université de Bourgogne Franche-Comté, Laboratoire de Mathématiques de Besançon.
- 2017 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, Development of mathematically-defined surfaces. Postgraduate Institute Conference.
- 2017 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, An analysis of Type F2 software measurement standards for profile surface texture parameters. Advanced Mathematical and Computational Tools in Metrology and Testing XI
- 2017 : Cuenin J, Faivre A, Kokonendji CC, On generalized variance of product of powered components and multiple stable Tweedie models, Statistics-Theory and Methods
- 2017 : Blateyron F, New Sliding Bandpass Filters for Multiscale Exploration of Surface Texture, Metrology and Properties of Engineering Surfaces. Poster
- 2017 : Faivre A, Dombry C, Total variation regularized non-negative matrix factorization for smooth hyperspectral unmixing, arXiv preprint arXiv:1706.09242, 2017
- 2017 : Bigerelle M, Marteau J, Blateyron F, Assessing the discriminating power of roughness parameters using a roughness databank, Surface Topography: Metrology and Properties. 5. 025002. 10.1088/2051-672X/aa6e04.
- 2017 : Todhunter L, Leach R, Lawes SDA, Harris P, Blateyron F, An analysis of Type F2 software measurement standards for profile surface texture parameters, Measurement Science and Technology
- 2016 : Mignot C, A whole new world of colour (and 3D) for electron microscopy, inFocus, revue de la Royal Society of Microscopy, UK.
- 2016 : Chrétien S, Dombry C, Faivre A, A Semi-Definite Programming approach to low dimensional embedding for unsupervised clustering, arXiv preprint arXiv:1606.09190
- 2016 : Faivre A, Chrétien S, Dombry C, A Semi-Definite Programming approach to Gaussian Mixture based clustering, Informal publication on ResearchGate.
- 2016 : Blateyron F, Segmentation and feature parameters - A corrected definition of watershed segmentation and feature parameters defined in ISO 25178-2, International Conference on Surface Metrology, Poznan, Pologne
- 2015 : Blateyron F, Proposed corrections for the ISO 25178 standard series on areal surface texture, Communication à l'ISO TC213 WG16
- 2014 : Blateyron F, Good practices for the use of areal filters, 3rd seminar on surface metrology of the Americas, Albuquerque, NM, USA
- 2014 : Blateyron F, Correlative surface analysis, International Conference on Surface Metrology, Hambourg, Allemagne
- 2013 : Blateyron F, The areal field parameters, chapter 2, Characterization of areal surface texture, Richard Learch ed, Springer, ISBN: 978-3-642-36457-0
- 2013 : Blateyron F, The areal feature parameters, chapter 3, Characterization of areal surface texture, Richard Learch ed, Springer, ISBN: 978-3-642-36457-0
- 2012 : Blateyron F, Preparation and cleaning of raw acquisition files, International Conference on Surface Metrology, Annecy, France
- 2012 : Blateyron F, Chromatic confocal microscopy, chapter 5, Optical measurement of surface topography, Richard Leach ed, Springer, ISBN: 978-3-642-12011-4
- 2011 : Blateyron F, Surface characterization based upon significant topographic features, 13th International Conference on Metrology and Properties of Engineering Surfaces, National Physical Laboratory, UK
- 2011: Hajri S, Sadier B, Jaillet S, Thomas M, Delannoy J-J, Identification and extraction by segmentation of speleothems of Orgnac, Cahiers de géographie, Edytem.
- 2010 : Blateyron F, Characterization of local features on functional surfaces, International Conference on Surface Metrology, WPI Worcester, USA
- 2010 : Blateyron F, Two advanced characterization methods of surface properties, Tribology Symposium, Tokyo, Japan
- 2010 : Hajri S, Modélisation des surfaces rocheuses naturelles à partir d’une scannerisation laser 3D et extraction automatique de formes caractéristiques : application aux spéléothèmes et surfaces géologiques. PhD Thesis. Université de Savoie-Mont Blanc.
- 2009 : Blateyron F, Calculating 3D surface texture parameters according to ASME B46.1 and ISO 25178, International Conference on Surface Metrology, WPI Worcester, USA
- 2009 : Hajri S, Sadier B, Jaillet S, Ployon E, Boche E, Chakroun A, Saulnier G-M, Delannoy J-J, Analyse spatiale et morphologique d'une forêt de stalagmites par modélisation 3D dans le réseau d'Orgnac, Karstologia, ISSN 0751-7688
- 2008 : Blateyron F, Caulcutt A, Surface Analysis Leaps into the Fourth Dimension, Quality Magazine, July
- 2007 : Blateyron F, 3D Oberflächen Messtechnik, Quality Engineering, Germany
- 2007 : Blateyron F, A revolution in 3D Surface Metrology, NDT Nondestructive testing (Quality Magazine)
- 2006 : Blateyron F, Etats de surface : la norme ISO 25178 va tout changer, Mesures, 787, pp44-47, France
- 2006 : Blateyron F, 3D Imaging and Analysis using Surface Metrology Software, Imaging & Microscopy
- 2006 : Blateyron F, 3D parameters and new filtration techniques, Japan Society of Production Engineering, Tokyo, Japon
- 2005 : Blateyron F, Cotation ISO : les nouvelles normes, quelles conséquences, Journée d'information technique, UNM, Paris
- 2004 : Blateyron F, Application of image segmentation to motifs evaluation on 2D profiles, International Colloquium on Surfaces, Chemnitz, Allemagne
- 2002 : Mignot C, Complementarity and similitudes between colorimetry and profilometry, International congress of dermatology, Skin health and disease, Paris